Dynamic force microscopy study of the Ga-rich c (8×2) and As-rich c (4×4) reconstructions of the GaAs(001) surface

Journal of Applied Physics

Volumn 102, Issue 2, 2007, Pages

  Kawai, Shigeki ^a,b,d   Rose, Franck ^a,c,e   Ishii, Takanori ^a   Tsukamoto, Shiro ^a   Kawakatsu, Hideki ^a,b  

^a INSTITUTE OF INDUSTRIAL SCIENCE   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c Centre National de la Recherche Scientifique   (Japan)

^d SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

^e UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC RESOLUTION; DYNAMIC FORCE MICROSCOPY; FREQUENCY SHIFT IMAGING; SURFACES RECONSTRUCTED;

DANGLING BONDS; FREQUENCY MODULATION; MICROSCOPIC EXAMINATION; SPUTTERING;

SEMICONDUCTING GALLIUM ARSENIDE;

EID: 34547581682     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2757001     Document Type: Article

References (41)

1. G. Binnig, H. Rohrer, Ch. Gerber, and E. Weibel, Phys. Rev. Lett. 50, 120 (1982).
2. G. Binnig, C. F. Quate, and Ch. Gerber, Phys. Rev. Lett. 56, 930 (1986).
3. R. M. Feenstra, J. Stroscio, J. Tersoff, and A. P. Fein, Phys. Rev. Lett. 58, 1192 (1987).
4. L. Bartels, G. Meyer, and K.-H. Rieder, Appl. Phys. Lett. 71, 213 (1997).
5. R. C. Jaklevic and J. J. Lambe, Phys. Rev. Lett. 17, 1139 (1966).
6. B. C. Stipe, M. A. Rezai, and W. Ho, Science 280, 1732 (1998).
7. Y. Sugimoto, P. Pou, M. Abe, P. Jelinek, R. Ṕrez, S. Morita, and Ó. Custance, Nature (London) 446, 64 (2007).
8. R. Hoffmann, L. N. Kantrovich, A. Baratoff, H. J. Hug, and H.-J. Güntherodt, Phys. Rev. Lett. 92, 146103 (2004).
9. J. J. Kolodziej, B. Such, and M. Szymonski, Phys. Rev. Lett. 90, 226101 (2003).
10. J. Tobik, I. Stich, and K. Terakura, Phys. Rev. B 63, 245324 (2001).
11. S. H. Ke, T. Uda, I. Stich, and K. Terakura, Phys. Rev. B 63, 245323 (2001).
12. A. G. Baca and C. I. H. Ashby, Fabrication of GaAs Devices (IEE, London, 2005).
13. Q. Xue, T. Hashizume, and T. Sakurai, Prog. Surf. Sci. 56, 1 (1997).
14. Q. Xue, T. Hashizume, and T. Sakurai, Appl. Surf. Sci. 141, 244 (1999).
15. V. P. LaBella, M. R. Krause, Z. Ding, and P. M. Thibado, Surf. Sci. Rep. 60, 1 (2005).
16. M. D. Pashley, K. W. Haberern, W. Friday, J. M. Woodall, and P. D. Kirchner, Phys. Rev. Lett. 60, 2176 (1988).
17. T. Eguchi, Phys. Rev. Lett. 93, 266102 (2004).
18. E. Penev, P. Kratzer, and M. Scheffler, Phys. Rev. Lett. 93, 146102 (2004).
19. O. Romanyuk, P. Jiíčrk, M. Cukr, and I. Bartoš, Surf. Sci. 566-568, 89 (2004).
20. A. Ohtake, J. Nakamura, S. Tsukamoto, N. Koguchi, and A. Natori, Phys. Rev. Lett. 89, 206102 (2002).
21. M. Takahasi and J. Mizuki, Phys. Rev. Lett. 96, 055506 (2006).
22. B. Such, J. J. Kolodziej, P. Czuba, F. Krok, P. Piatkowski, P. Struski, and M. Szymonski, Surf. Sci. 530, 149 (2003).
23. J. J. Kolodziej, B. Such, and M. Szymonski, Phys. Rev. B 71, 165419 (2005).
24. J. J. Kolodziej, B. Such, M. Goryl, F. Krok, P. Piatkowski, and M. Szymonski, Appl. Surf. Sci. 252, 7614 (2006).
25. S. Lee, W. Moritz, and M. Scheffler, Phys. Rev. Lett. 85, 3890 (2000).
26. C. Kumpf, Phys. Rev. Lett. 86, 3586 (2001).
27. S. Kawai, D. Kobayashi, S. Kitamura, S. Meguro, and H. Kawakatsu, Rev. Sci. Instrum. 76, 083703 (2005).
28. S. Morita, R. Wiesendanger, and E. Meyer, Noncontact Atomic Force Microscopy (Springer, Berlin, 2002).
29. T. R. Albrecht, P. Grütter, D. Horne, and D. Rugar, J. Appl. Phys. 69, 668 (1991).
30. F. J. Giessibl, Science 267, 68 (1995).
31. F. J. Giessibl, Phys. Rev. B 56, 16010 (1997).
32. S. Kawai, F. Rose, T. Ishii, and H. Kawakatsu, J. Appl. Phys. 99, 104312 (2006).
33. D. K. Biegelsen, R. D. Bringans, J. E. Northrup, and L.-E. Swartz, Phys. Rev. B 41, 5701 (1990).
34. M. Sauvage-Simkim, R. Pinchaux, J. Massies, P. Calverie, N. Jedrecy, J. Bonnet, and I. K. Robinson, Phys. Rev. Lett. 62, 563 (1989).
35. A. Ohtake, P. Kocán, J. Nakamura, A. Natori, and N. Koguchi, Phys. Rev. Lett. 92, 236105 (2004).
36. A. J. van Bommel, J. E. Crombeen, and T. G. J. van Oirschot, Surf. Sci. 72, 95 (1978).
37. R. Duszak, C. J. Palmstrom, L. T. Florez, Y.-N. Yang, and J. H. Weaver, J. Vac. Sci. Technol. B 10, 1891 (1992).
38. A. Ohtake, J. Nakamura, N. Koguchi, and A. Natori, Surf. Sci. 566-568, 58 (2004).
39. U. Valbusa, C. Boragno, and F. Buatier de Mongeot, J. Phys.: Condens. Matter 14, 8153 (2002).
40. D. Datta, S. R. Bhattacharyya, T. K. Chini, and M. K. Sanyal, Nucl. Instrum. Methods Phys. Res. B 193, 596 (2002).
41. T. Chini, D. Datta, S. R. Bhattacharyya, and M. K. Sanyal, Appl. Surf. Sci. 182, 313 (2001).