Surface structure investigations using noncontact atomic force microscopy

Applied Surface Science

Volumn 252, Issue 21, 2006, Pages 7614-7623

  Kolodziej, J J ^a   Such, B ^a   Goryl, M ^a   Krok, F ^a   Piatkowski, P ^a   Szymonski, M ^a  

^a JAGIELLONIAN UNIVERSITY   (Poland)

Author keywords

Atomic force microscopy; III V semiconductors; Surface structure

Indexed keywords

ATOMIC FORCE MICROSCOPY; IMAGING TECHNIQUES; MATHEMATICAL MODELS; SEMICONDUCTOR MATERIALS;

COMPOUND SEMICONDUCTORS; NONCONTACT ATOMIC FORCE MICROSCOPY (NC-AFM);

SURFACE STRUCTURE;

EID: 33747165330     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2006.03.054     Document Type: Article

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