Recipes for cantilever parameter determination in dynamic force spectroscopy: Spring constant and amplitude

Nanotechnology

Volumn 18, Issue 25, 2007, Pages

  Simon, Georg Hermann ^a   Heyde, Markus ^a   Rust, Hans Peter ^a  

^a FRITZ HABER INSTITUT DER MAX PLANCK GESELLSCHAFT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRON TUNNELING; FORCE MEASUREMENT; PARAMETER ESTIMATION; SCANNING TUNNELING MICROSCOPY; SPRINGS (COMPONENTS);

DYNAMIC FORCE MICROSCOPY; DYNAMIC FORCE SPECTROSCOPY; OSCILLATION AMPLITUDE; QUARTZ TUNING FORKS;

CANTILEVER BEAMS;

ARTICLE; CALCULATION; CALIBRATION; FREQUENCY MODULATION; OSCILLATION; PRIORITY JOURNAL; SCANNING TUNNELING MICROSCOPY; SENSOR; SIMULATION; SPECTROSCOPY;

EID: 34347214025     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/18/25/255503     Document Type: Article

References (57)

1. Sader J E and Jarvis S P 2004 Accurate formulas for interaction force and energy in frequency modulation atomic force spectroscopy Appl. Phys. Lett. 84 1801
2. Hölscher H, Allers W, Schwarz U D, Schwarz A and Wiesendanger R 1999 Determination of tip-sample interaction potentials by dynamic force spectroscopy Phys. Rev. Lett. 83 4780
3. Gotsmann B, Anczykowski B, Seidel C and Fuchs H 1999 Determination of tip-sample interaction forces from measured dynamic force spectroscopy curves Appl. Surf. Sci. 140 314
4. Hölscher H, Schwarz A, Allers W, Schwarz U D and Wiesendanger R 2000 Quantitative analysis of dynamic-force-spectroscopy data on graphite(0001) in the contact and noncontact regimes Phys. Rev. B 61 12678
5. Gotsmann B and Fuchs H 2001 Dynamic force spectroscopy of conservative and dissipative forces in an Al-Au(111) tip-sample system Phys. Rev. Lett. 86 2597
6. Lantz M A, Hug H J, Hoffmann R, van Schendel P J A, Kappenberger P, Martin S, Baratoff A and Güntherodt H-J 2001 Quantitative measurement of short-range chemical bonding Forces Science 291 2580
7. Heyde M, Kulawik M, Rust H-P and Freund H-J 2006 Frequency-modulated atomic force microscopy on NiAl(110) partially covered with a thin alumina film Phys. Rev. B 73 125320
8. Giessibl F J 2003 Advances in atomic force microscopy Rev. Mod. Phys. 75 949
9. Giessibl F J 2000 Atomic resolution on Si(111)-(7 × 7) by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork Appl. Phys. Lett. 76 1470
10. Günther P, Fischer U and Dransfeld K 1989 Scanning near-field acoustic microscopy Appl. Phys. B 48 89
11. Karrai K and Grober R D 1995 Piezoelectric tip-sample distance control for near-field optical microscopes Appl. Phys. Lett. 66 1842
12. Steinke R, Hoffmann M, Böhmisch M, Eisenmenger J, Dransfeld K and Leiderer P 1997 Potentiometry with the acoustic near field microscope: a new method for microscopy of surface potentials Appl. Phys. A 64 19
13. Edwards H, Taylor L, Duncan W and Melmed A J 1997 Fast, high-resolution atomic force microscopy using a quartz tuning fork as actuator and sensor J. Appl. Phys. 82 980
14. Atia W A and Davis C C 1997 A phase-locked shear-force microscope for distance regulation in near-field optical microscopy Appl. Phys. Lett. 70 405
15. Ihn Th 2004 Springer Tracts in Modern Physics vol 192 (New York: Springer) chapter 14
16. Heyde M, Kulawik M, Rust H-P and Freund H-J 2004 Double quartz tuning fork sensor for low temperature atomic force and scanning tunnelling microscopy Rev. Sci. Instrum. 75 2446
17. Rust H-P, Heyde M and Freund H-J 2006 Signal electronics for an atomic force microscope equipped with a double quartz tuning fork sensor Rev. Sci. Instrum. 77 043710
18. Heyde M, Sturm H and Rademann K 1999 New application for the calibration of scanning probe microscopy piezos Surf. Interface Anal. 27 291
19. Heyde M, Sterrer M, Rust H-P and Freund H-J 2005 Atomic resolution on MgO(001) by atomic force microscopy using a double quartz tuning fork sensor at low-temperature and ultrahigh vacuum Appl. Phys. Lett. 87 083104
20. Schintke S, Messerli S, Pivetta M, Patthey F, Libioulle L, Stengel M, De Vita A and Schneider W-D 2001 Insulator at the ultrathin limit: MgO on Ag(001) Phys. Rev. Lett. 87 276801
21. Li Y and Lindsay S M 1991 Polystyrene latex particles as a size calibration for the atomic force microscope Rev. Sci. Instrum. 62 2630
22. Aliata D, Cecconi C and Nicolini C 1996 A simple method for preparing calibration standards for the three working axes of scanning probe microscope piezo scanners Rev. Sci. Instrum. 67 748
23. Vesenka J, Manne S, Giberson R, Marsh T and Henderson E 1993 Colloidal gold particles as an incompressible atomic force microscope imaging standard for assessing the compressibility of biomolecules Biophys. J. 65 992
24. Pal S and Banerjee S 2000 A simple technique for height calibration for z piezo with Angstrom resolution of scanning probe microscopes Rev. Sci. Instrum. 71 589
25. Florin E-L, Rief M, Lehmann H, Ludwig M, Dornmair C, Moy V T and Gaub H E 1995 Sensing specific molecular interactions with the atomic force microscope Biosens. Bioelectron. 10 895
26. Burnham N A, Chen X, Hodges C S, Matei G A, Thoreson E J, Roberts C J, Davies M C and Tendler S J B 2003 Comparison of calibration methods for atomic-force microscopy cantilevers Nanotechnology 14 1
27. Green C T, Lioe H, Cleveland J P, Proksch R, Mulvaney P and Sader J E 2004 Normal and torsional spring constants of atomic force microscope cantilevers Rev. Sci. Instrum. 75 1988
28. Gibson C T, Smith D A and Roberts C J 2005 Calibration of silicon atomic force microscope cantilevers Nanotechnology 16 234
29. Clifford C A and Seah M P 2005 The determination of atomic force microscope cantilever spring constants via dimensional methods for nanomechanical analysis Nanotechnology 16 1666
30. Sader J E 1995 Parallel beam approximation for V-shaped atomic force microscope cantilevers Rev. Sci. Instrum. 66 4583
31. Cleveland J P, Manne S, Bocek D and Hansma P K 1993 A nondestructive method for determining spring constant of cantilevers for scanning force microscopy Rev. Sci. Instrum. 64 403
32. Gibson C T, Weeks B L, Lee J R I, Abell C and Rayment T 2001 A nondestructive technique for determining the spring constant of atomic force microscope cantilevers Rev. Sci. Instrum. 72 2340
33. Sader J E, Larson I, Mulvaney P and White L R 1995 Method for the calibration of atomic force microscope cantilevers Rev. Sci. Instrum. 66 3789
34. Sader J E, Chon J W M and Mulvaney P 1999 Calibration of rectangular atomic force microscope cantilevers Rev. Sci. Instrum. 70 3967
35. Hutter J L and Bechhoefer J 1993 Calibration of atomic-force microscope tips Rev. Sci. Instrum. 64 1868
36. Hutter J L and Bechhoefer J 1993 Calibration of atomic-force microscope tips Rev. Sci. Instrum. 64 1868
37. Hutter J L and Bechhoefer J 1993 Rev. Sci. Instrum. 64 3342 (Erratum)
38. Levy R and Maaloum M 2002 Measuring the spring constant of atomic force microscope cantilevers: thermal fluctuations and other methods Nanotechnology 13 33
39. McFarland A W, Poggi M A, Bottomley L A and Colton J S 2005 Characterization of microcantilevers solely by frequency response acquisition J. Micromech. Microeng. 15 785
40. Rychen J, Ihn T, Studerus P, Herrmann A and Ensslin K 2000 Operation characteristics of piezoelectric quartz tuning forks in high magnetic fields at liquid helium temperatures Rev. Sci. Instrum. 71 1695
41. Timoshenko S 1984 Strength of Materials (Malabar, FL: Krieger)
42. Neumeister J M and Ducker W A 1994 Lateral, normal, and longitudinal spring constants of atomic force microscopy cantilevers Rev. Sci. Instrum. 65 2527
43. Senden T J and Ducker W A 1994 Experimental determination of spring constants in atomic force microscopy Langmuir 10 1003
44. Gibson C T, Watson G S and Myhra S 1996 Determination of the spring constants of probes for force microscopy/spectroscopy Nanotechnology 7 259
45. Torii A, Sasaki M, Hane K and Okuma S 1996 A method for determining the spring constant of cantilevers for atomic force microscopy Meas. Sci. Technol. 7 179
46. Jericho S K and Jericho M H 2002 Microelectromechanical system device for the determination of spring constants of atomic force microscope cantilevers and micromachined springs Rev. Sci. Instrum. 73 2483
47. Cumpson P J, Hedley J and Zhdan P 2003 Accurate force measurement in the atomic force microscope: a microfabricated array of reference springs for easy cantilever calibration Nanotechnology 14 918
48. Cumpson P J, Hedley J, Clifford C A, Chen X and Allen S 2004 Device for calibration of atomic force microscope cantilever spring constants between 0.01 and 4 N/m J. Vac. Sci. Technol. A 22 1444
49. Morel N, Ramonda M and Tordjeman P 2005 Cantilever calibration for nanofriction experiments with atomic force microscope Appl. Phys. Lett. 86 163103
50. Matthees W 2005 private communication, Bundesanstalt für Materialforschung und-prüfung (BAM), Unter den Eichen 87, D-12205 Berlin, Germany
51. Chen B-Y, Yeh M-K and Tai N-H 2007 Accuracy of the spring constant of atomic force microscopy cantilevers by finite element method Anal. Chem. 79 1333
52. Wolfram Research, Inc. 2003 Mathematica Version 5.0.0.0 100 Trade Center Drive, Champaign, IL 61820-7237 USA
53. Giessibl F J 2001 A direct method to calculate tip-sample forces from frequency shifts in frequency-modulation atomic force microscopy Appl. Phys. Lett. 78 123
54. Giessibl F J and Bielefedt H 2000 Physical interpretation of frequency-modulation atomic force microscopy Phys. Rev. B 61 9968
55. Dürig U 1999 Relation between interaction force and frequency shift in large-amplitude dynamic force microscopy Appl. Phys. Lett. 75 433
56. Heyde M, Sterrer M, Rust H-P and Freund H-J 2006 Frequency modulated atomic force microscopy on MgO(001) thin films: interpretation of atomic image resolution and distance dependence of tip-sample interaction Nanotechnology 17 S101
57. Guggisberg M, Bammerlin M, Loppacher Ch, Pfeiffer O, Abdurixit A, Barwich V, Bennewitz R, Baratoff A, Meyer E and Güntherodt H-J 2000 Separation of interactions by noncontact force microscopy Phys. Rev. B 61 11151