Frequency modulated atomic force microscopy on MgO(001) thin films: Interpretation of atomic image resolution and distance dependence of tip-sample interaction

Nanotechnology

Volumn 17, Issue 7, 2006, Pages

  Heyde, M ^a   Sterrer, M ^a   Rust, H P ^a   Freund, H J ^a  

^a FRITZ HABER INSTITUT DER MAX PLANCK GESELLSCHAFT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELASTICITY; MAGNESIA; MATHEMATICAL MODELS; TEMPERATURE MEASUREMENT; THIN FILMS; ULTRAHIGH VACUUM;

ATOMIC IMAGE RESOLUTION; CURVE ELASTIC DEFORMATIONS; REPULSIVE REGIME; RYDBERG MODEL;

ATOMIC FORCE MICROSCOPY;

EID: 33644978016     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/17/7/S01     Document Type: Article

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