Potentiometry with the acoustic near field microscope: A new method for microscopy of surface potentials

Applied Physics A: Materials Science and Processing

Volumn 64, Issue 1, 1996, Pages 19-27

  Steinke, R ^a   Hoffmann, M ^a   Bohmisch M ^a   Eisenmenger, J ^a   Dransfeld, K ^a   Leiderer, P ^a  

^a UNIVERSITY OF KONSTANZ   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONTACTS; ELECTRIC CURRENT MEASUREMENT; ELECTRIC PROPERTIES; HALL EFFECT; LOW TEMPERATURE PHENOMENA; MAGNETIC FIELD EFFECTS; MICROSCOPIC EXAMINATION; POTENTIOMETERS (ELECTRIC MEASURING INSTRUMENTS); PROBES; SURFACES;

ACOUSTIC NEAR FIELD MICROSCOPES; CONTACT POTENTIAL; HALL VOLTAGES; QUANTUM HALL EFFECT; SURFACE TOPOGRAPHY;

ELECTRIC VARIABLES MEASUREMENT;

EID: 0030834943     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s003390050439     Document Type: Article

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