SCOPUS 정보 검색 플랫폼 - 논문 보기

메뉴 건너뛰기

Volumn 13, Issue 1, 2002, Pages 33-37

Measuring the spring constant of atomic force microscope cantilevers: Thermal fluctuations and other methods

(2) Levy R a Maaloum, M a

a INSTITUT CHARLES SADRON (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; BENDING (DEFORMATION); COMPUTATIONAL METHODS; MATHEMATICAL MODELS; MECHANICAL VARIABLES MEASUREMENT; THERMAL EFFECTS;

SPRING CONSTANT; THERMAL FLUCTUATIONS;

CANTILEVER BEAMS;

EID: 0036472312 PISSN: 09574484 EISSN: None Source Type: Journal
DOI: 10.1088/0957-4484/13/1/307 Document Type: Article

Times cited : (332)

References (26)

1
- 0028020164
- (1994) Science , vol.265 , pp. 2071
- Frisbie, C.D.¹ Rozsnyai, L.F.² Noy, A.³ Wrighton, M.S.⁴ Lieber, C.M.⁵

2
- 0008520038
- (1999) Science , vol.283 , pp. 1730
- Grandbois, M.¹ Rief, M.² Clausen-Shaumann, H.³ Gaub, H.E.⁴

3
- 0031042739
- (1997) Science , vol.275 , pp. 1295
- Rief, M.¹ Oesterhelt, F.² Heymann, B.³ Gaub, H.E.⁴

4
- 0033154095
- (1999) Macromolecules , vol.32 , pp. 4989
- Maaloum, M.¹ Courvoisier, A.²

5
- 0033613073
- (1999) Proc. Natl Acad. Sci. USA , vol.96 , pp. 11277
- Strunz, T.¹ Oroszlan, K.² Schäfer, R.³ Güntherodt, H.-J.⁴

6
- 0034069676
- (2000) Biophys. J. , vol.78 , pp. 1997
- Clausen-Schaumann, H.¹ Rief, M.² Tolksdorf, C.³ Gaub, H.E.⁴

7
- 0028309424
- (1994) Science , vol.264 , pp. 415
- Florin, E.L.¹ Moy, V.T.² Gaub, H.E.³

8
- 0028736993
- (1994) Proc. Microsc. Soc. Am. , vol.52 , pp. 1054
- Hoh, J.H.¹ Hillner, P.E.² Hansma, P.K.³

9
- 0342350248
- (2000) Phys. Rev. Lett. , vol.84 , pp. 6126
- Heymann, B.¹ Grubmuller, H.²

10
- 36449007442
- (1993) Rev. Sci. Instrum. , vol.64 , pp. 1868
- Hutter, J.L.¹ Bechhoefer, J.²

11
- 0027540056
- (1993) Rev. Sci. Instrum. , vol.64 , pp. 403
- Cleveland, J.P.¹ Manne, S.² Bocek, D.³ Hansma, P.K.⁴

12
- 0000058768
- (1993) Langmuir , vol.9 , pp. 637
- Li, Y.Q.¹ Tao, N.J.² Pan, J.³ Garcia, A.A.⁴ Lindsay, S.M.⁵

13
- 0028422252
- (1994) Langmuir , vol.10 , pp. 1003
- Senden, T.J.¹ Ducker, W.A.²

14
- 36449006239
- (1993) J. Appl. Phys. , vol.74 , pp. 1
- Sader, J.E.¹ White, L.²

15
- 36449002856
- (1995) Rev. Sci. Instrum. , vol.66 , pp. 3789
- Sader, J.E.¹ Larson, I.² Mulvaney, P.³ White, L.R.⁴

16
- 0000815047
- (1994) Rev. Sci. Instrum. , vol.65 , pp. 2527
- Neumeister, J.M.¹ Ducker, W.A.²

17
- 34347209835
- (1995) Nanotechnology , vol.6 , pp. 1
- Butt, H.-J.¹ Jaschke, M.²

18
- 0030234766
- (1996) Nanotechnology , vol.7 , pp. 259
- Gibson, C.T.¹ Watson, G.S.² Myhra, S.³

19
- 0001026801
- (1996) Meas. Sci. Technol. , vol.7 , pp. 179
- Torii, A.¹ Sasaki, M.² Hane, K.³ Shigeru, O.⁴

20
- 58749086215
- (1997) Proc. SPIE , vol.3009 , pp. 53
- Tortonese, M.¹ Kirk, M.²

21
- 0345440111
- (1999) Sensors Actuators , vol.74 , pp. 134
- Serre, C.¹ Pérez-Rodríguez, A.² Morante, J.R.³ Gorostiza, P.⁴ Esteve, J.⁵

22
- 0001155528
- (1999) Rev. Sci. Instrum. , vol.70 , pp. 3967
- Sader, J.E.¹ Chon, J.W.M.² Mulvaney, P.³

23
- 0034317617
- (2000) Langmuir , vol.16 , pp. 9282
- Maeda, N.¹ Senden, T.J.²

24
- 36449007507
- (1995) Rev. Sci. Instrum. , vol.66 , pp. 4583
- Sader, J.E.¹

25
- 0029075240
- (1995) Scanning , vol.17 , pp. 117
- Radmacher, M.¹ Cleveland, J.P.² Hansma, P.K.³

26
- 0035136028
- (2001) Ultramicroscopy , vol.86 , pp. 207
- Stark, R.W.¹ Drobek, T.² Heckl, W.M.³

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.