Signal electronics for an atomic force microscope equipped with a double quartz tuning fork sensor

Review of Scientific Instruments

Volumn 77, Issue 4, 2006, Pages

  Rust, H P ^a   Heyde, M ^a   Freund, H J ^a  

^a FRITZ HABER INSTITUT DER MAX PLANCK GESELLSCHAFT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BANDPASS FILTERS; OPTICAL SENSORS; SCANNING TUNNELING MICROSCOPY; SIGNAL DETECTION; SIGNAL PROCESSING; SUPERFLUID HELIUM;

FREQUENCY DETECTION; SIGNAL ELECTRONICS; TUNING FORK;

ATOMIC FORCE MICROSCOPY;

EID: 33646388962     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2194490     Document Type: Article

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