Phase separation in InxGa1-xN

Philosophical Magazine

Volumn 87, Issue 13, 2007, Pages 1983-1998

  Bartel, T P ^a,c   Specht, P ^b   Ho, J C ^b   Kisielowski, C ^c  

^a TECHNISCHE UNIVERSITÄT BERLIN   (Germany)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LATTICE CONSTANTS; PHASE SEPARATION; SEMICONDUCTOR QUANTUM WELLS; TRANSMISSION ELECTRON MICROSCOPY; WAVELENGTH;

CLUSTER FORMATION; LATTICE IMAGE; SAMPLE THICKNESS; STRAIN MAPPING;

SEMICONDUCTING INDIUM COMPOUNDS;

EID: 34248549122     PISSN: 14786435     EISSN: 14786443     Source Type: Journal    
DOI: 10.1080/14786430601146905     Document Type: Article

References (45)

1. S. Nakamura and G. Fasol, The Blue Laser Diode - GaN-based Light Emitters and Lasers (Springer-Verlag, Heidelberg, 1997).
2. C. Kisielowski, Z. Liliental-Weber and S. Nakamura, Jap. J. Appl. Phys. 36 6932 (1997).
3. I-hsiu Hu and G.B. Stringfellow, Appl. Phys. Lett. 6 2701 (1996).
4. S.Y. Karpov, MRS Internet J. Nitride Semicond. Res. 3 16 (1998).
5. L.H. Robins, J.T. Armstrong, B. Marinenko, et al., 2000 IEEE International Symposium on Compound Semiconductors (IEEE, 2000), pp. 507-512.
6. H. Naoi, M. Kurouchi, D. Muto, et al., Phys. Stat. Sol. (a) 203 93 (2006).
7. E. Iliopoulos, A. Georgakilas, E. Dimakis, et al., Phys. Stat. Sol. (a) 203 102 (2006).
8. S. Kret, P. Ruterana and A. Rosenauer, Phys. Stat. Sol. 227 247 (2001).
9. C. Kisielowski, P. Schwander, F.H. Baumann, et al., Ultramicroscopy 58 131 (1995).
10. C. Kisielowski and O. Schmidt, Microsc. Microanal. 4 614 (1998).
11. M.J. Hytch, E. Snoeck and R. Kilaas, Ultramicroscopy 74 131 (1998).
12. H. Lakner, Q. Liu, G. Brockt, et al., Mater. Sci. Engng B 51 44 (1998).
13. J.R. Jinschek, C. Kisielowski, D. Van Dyck, et al., Proc., SPIE Int. Soc. Opt. Eng. 5187 54 (2004).
14. J.S. Barnard, M.E. Vickers, M.J. Kappers, et al., Inst. of Phys. Conference Series No. 180 (2004), pp. 57-60.
15. T. Bartel, J.R. Jinschek, B. Freitag, et al., Phys. Stat. Sol. (a) 203 167 (2006).
16. C. Kisielowski, paper presented at the 2nd International Symposium on Blue Laser and Light-Emitting Diodes, Chiba, Japan (1998).
17. X. Xu, S.P. Beckman, P. Specht, et al., Phys. Rev. Lett. 95 145501 (2005).
18. J.R. Jinschek, C. Kisielowski, D. Van Dyck, et al., Proc. SPIE Int. Soc. Opt. Eng. 5187 54 (2004).
19. M.J. Hytch and T. Plamann, Ultramicroscopy 87 199 (2001).
20. M.M.J. Treacy and J.M. Gibson, J. Vac. Sci. Technol. B 4 1458 (1986).
21. K. Tillmann, M. Lentzen and R. Rosenfeld, Ultramicroscopy 83 111 (2000).
22. T.M. Smeeton, M.J. Kappers, J.S. Barnard, et al., Appl. Phys. Lett. 83 5419 (2003).
23. T. Li, E. Hahn, D. Gerthsen, et al., Appl. Phys. Lett. 86 241911 (2005).
24. J.R. Jinschek and C. Kisielowski, Physica B 376-377 536 (2006).
25. A.N. Westmeyer and S. Mahajan, Appl. Phys. Lett. 79 2710 (2001).
26. M. Rao, D. Kim and S. Mahajan, Appl. Phys. Lett. 85 1961 (2004).
27. A. Brana, B. Pecz and M. Menyhard, Ultramicroscopy 70 16 (1998).
28. C. Kisielowski, P. Schwander, F.H. Baumann, et al., Ultramicroscopy 58 131 (1995).
29. C. Kisielowski, O. Schmidt and J. Yang, Mater. Res. Soc. Symp. 482 369 (1998).
30. P. Perlin, C. Kisielowski, V. Iota, et al., Appl. Phys. Lett. 73 2778 (1998).
31. H. Lu, W.J. Schaff, J. Hwang, et. al., Appl. Phys. Lett. 77 2548 (2000).
32. Z. Liliental-Weber, D.N. Zakharov, K.M. Yu, et al., J. Electron Microsc. 54 243 (2005).
33. M. Op de Beeck, D. Van Dycke and W. Coene, Ultramicroscopy 64 167 (1996).
34. A. Thust, W.M.J. Coene, M. Op de Beeck, et al., Ultramicroscopy 64 211 (1996).
35. C. Kisielowski, C.J.D. Hetherington, Y.C. Wang, et al., Ultramicroscopy 89 243 (2001).
36. A. Rosenauer, D. Ghertsen and V. Potin, Phys. Stat. Sol. (a) 203 176 (2006).
37. J.F. Zheng, J.D. Walker, M.B. Salmeron, et al., Phys. Rev. Lett. 72 2414 (1994).
38. J.W. Cahn, Acta Metall. 9 795 (1961).
39. J.M. Hyde, A.P. Sutton, J.R.G. Harris, et al., Model. Simul. Mater. Sci. Engng 4 33 (1996).
40. C.-C. Chuo, C.-M. Lee and J.-I. Chyi, Appl. Phys. Lett. 78 314 (2001).
41. S. Li, Growth and Characterization of cubic InGaN and InGaN/GaN quantum wells, PhD thesis, Universität Paderborn, Germany (2005).
42. P. Ruterana, S. Kret, A. Vivet, et al., J. Appl. Phys. 91 8979 (2002).
43. J. Wu, W. Walukiewicz, K.M. Yu, et al., Appl. Phys. Lett. 80 4741 (2002).
44. R. Kenzler, F. Eurich, P. Maass, et al., Comput. Phys. Commun. 133 139 (2001).
45. Available online at: http://ncem.lbl.gov/team3.htm (accessed December 13, 2006).