Local Strain Measurements in Hexagonal Systems

Microscopy and Microanalysis

Volumn 4, Issue , 1998, Pages 614-615

  Kisielowski, Christian ^a   Schmidt, Olaf ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 22444455482     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927600023199     Document Type: Article

References (3)

1. H. Seitz, M. Seibt, F.H. Baumann, K. Ahlborn et al., phys. stat. sol. (a) 150 (1995) 625
2. K.G.F. Janssens, O. Van der Biest, J. Vanhellemont, HE. Maes, R. Hull, Appl. Phys. Lett. 67 (1995) 1530
3. C. Kisielowski, O. Schmidt, J. Yang, Mat. Res. Soc. Proc, Boston (1997), in press