Some issues of hot-carrier degradation and negative bias temperature instability of advanced SOI CMOS transistors

Solid-State Electronics

Volumn 51, Issue 2, 2007, Pages 268-277

  Ioannou, D P ^a   Ioannou, D E ^a  

^a IBM   (United States)

Author keywords

Floating body effect (FBE); Hot carriers; Negative bias temperature instability (NBTI); Self heating; Silicon on insulator technology

Indexed keywords

AGING OF MATERIALS; CHARGE CARRIERS; DEGRADATION; SILICON ON INSULATOR TECHNOLOGY; TRANSISTORS;

CHANNEL WIDTH; FLOATING BODY EFFECT (FBE); NEGATIVE BIAS TEMPERATURE INSTABILITY (NBTI); SELF HEATING;

CMOS INTEGRATED CIRCUITS;

EID: 33847305033     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sse.2007.01.004     Document Type: Article

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