A thermal activation view of low voltage impact ionization in MOSFETs

IEEE Electron Device Letters

Volumn 23, Issue 9, 2002, Pages 550-552

  Su, Pin ^b   Goto, Ken Ichi ^a,c   Sugii, Toshihiro ^c   Hu, Chenming ^a,b  

^a IEEE

^b UNIVERSITY OF CALIFORNIA   (United States)

^c FUJITSU LABORATORIES LTD   (Japan)

Author keywords

Hot carrier; Impact ionization; Power supply scaling; Thermal activation energy

Indexed keywords

ACTIVATION ENERGY; FABRICATION; HOT CARRIERS; IMPACT IONIZATION; THERMAL EFFECTS;

LOW VOLATAGE IMPACT IONIZATION;

MOSFET DEVICES;

EID: 0036714207     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2002.802653     Document Type: Article

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