Local structure, composition and electronic properties of rare earth oxide thin films studied using advanced transmission electron microscopy techniques (TEM-EELS)

Topics in Applied Physics

Volumn 106, Issue , 2006, Pages 153-177

  Schamm, Sylvie ^a   Scarel, Giovanna ^b   Fanciulli, Marco ^c  

^a CEMES CNRS   (France)

^b LABORATORIO MDM   (Italy)

^c NONE

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33750819693     PISSN: 03034216     EISSN: 14370859     Source Type: Book Series    
DOI: 10.1007/11499893_11     Document Type: Article

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