Study of the dielectric properties near the band gap by VEELS: Gap measurement in bulk materials

Ultramicroscopy

Volumn 96, Issue 3-4, 2003, Pages 559-564

  Schamm, S ^a   Zanchi, G ^a  

^a CEMES CNRS   (France)

Author keywords

Band gap; BN; Dielectric function; Ga2O3; GaN; MgO; SrTiO3; Valence electron energy loss spectroscopy; Wide band gap materials; ZnO

Indexed keywords

CRYSTALLINE MATERIALS; DIELECTRIC PROPERTIES; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON SCATTERING; MATHEMATICAL TECHNIQUES;

BANDGAP; VALENCE ELECTRON ENERGY LOSS SPECTROSCOPY (VEELS);

MATERIALS SCIENCE;

BORON; GALLIUM; MAGNESIUM OXIDE; NITROGEN; STRONTIUM; TITANIUM; ZINC OXIDE;

ACCURACY; ARTIFACT; CONFERENCE PAPER; CRYSTAL; DIELECTRIC CONSTANT; ELECTRON ENERGY LOSS SPECTROSCOPY; ENERGY; MATERIALS; MATHEMATICAL ANALYSIS; MEASUREMENT; STUDY; TECHNIQUE;

EID: 0038502000     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(03)00116-5     Document Type: Conference Paper

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