High-voltage management in single-supply CHE NOR-type flash memories

Proceedings of the IEEE

Volumn 91, Issue 4, 2003, Pages 554-567

  Motta, Ilaria ^a,b   Ragone, Giancarlo ^b   Khouri, Osama ^b   Torelli, Guido ^a,c   Micheloni, Rino ^a,b  

^a IEEE   (Italy)

^b STMICROELECTRONICS   (Italy)

^c UNIVERSITY OF PAVIA   (Italy)

Author keywords

Drain voltage regulation; Erase and verify; Flash memories; Gate voltage regulation; Hierarchical decoders; High voltage management; Program and verify; Staircase gate voltage generation; Standby management

Indexed keywords

COMBINATORIAL CIRCUITS; DATA STORAGE EQUIPMENT; GATES (TRANSISTOR); LOGIC CIRCUITS; RANDOM ACCESS STORAGE; ROM;

DRAIN VOLTAGE REGULATION; ERASE AND VERIFY; GATE VOLTAGE REGULATIONS; HIERARCHICAL DECODERS; HIGH-VOLTAGE MANAGEMENT; PROGRAM AND VERIFY; STAIRCASE GATE VOLTAGE GENERATION; STANDBY MANAGEMENT;

FLASH MEMORY;

EID: 33646836459     PISSN: 00189219     EISSN: None     Source Type: Journal    
DOI: 10.1109/JPROC.2003.811706     Document Type: Review

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