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Volumn 4, Issue , 2002, Pages 1322-1326

Improved charge pump for flash memory applications in triple-well CMOS technology

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE PUMP CIRCUITS; CHARGE TRANSFER; CHARGE TRANSFER DEVICES; CMOS INTEGRATED CIRCUITS; ELECTRIC RESISTANCE; ELEVATORS; INDUSTRIAL ELECTRONICS;

EID: 84902317767     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/isie.2002.1025982     Document Type: Conference Paper
Times cited : (17)

References (12)
  • 1
    • 85056969203 scopus 로고
    • Stress-induced current in thin silicon dioxide film
    • R. Moazzami and C. Hu, "Stress-induced current in thin silicon dioxide film", IEEE IEDMTechnical Digest. 1992, pp. 139-141
    • (1992) IEEE IEDM Technical Digest , pp. 139-141
    • Moazzami, R.1    Hu, C.2
  • 5
    • 0031212918 scopus 로고    scopus 로고
    • Flash memory cells - An overview
    • Aug
    • P. Pavan, R. Bez, P. Olivo. and E. Zanoni. "Flash memory cells - An overview", Proc. IEEE, vol. 85, no. 8. Aug. 1997, pp. 1248-1271
    • (1997) Proc. IEEE , vol.85 , Issue.8 , pp. 1248-1271
    • Pavan, P.1    Bez, R.2    Olivo, P.3    Zanoni, E.4
  • 7
    • 0016961262 scopus 로고
    • On-chip high voltage generation in MTMOS integrated circuits using an improved voltage multiplier technique
    • June
    • Dickson. "On-chip high voltage generation in MTMOS integrated circuits using an improved voltage multiplier technique", IEEE J. Solid-Stale Circuits, vol. SC-11. no. 3. June 1976, pp. 374-378
    • (1976) IEEE J. Solid-Stale Circuits , vol.11 SC , Issue.3 , pp. 374-378
    • Dickson, J.1
  • 8
    • 0031210141 scopus 로고    scopus 로고
    • A dynamic analysis of the Dickson charge pump circuit
    • Aug
    • T. Tanzawa and T. Tanaka, "A dynamic analysis of the Dickson charge pump circuit", IEEE J. Solid-Stale Circuits, vol. SC-32, no. 8. Aug. 1997. pp. 1231-1240
    • (1997) IEEE J. Solid-Stale Circuits , vol.32 SC , Issue.8 , pp. 1231-1240
    • Tanzawa, T.1    Tanaka, T.2
  • 9
    • 0034247158 scopus 로고    scopus 로고
    • A new charge pump without degradation in threshold voltage due to body effect
    • Aug
    • J. Shin. I. Chung. Y. J. Park, and H. S. Min. "A new charge pump without degradation in threshold voltage due to body effect", IEEE J. Solid-Stale Circuits, vol. 35, no. 8, Aug. 2000. pp. 1227-1230
    • (2000) IEEE J. Solid-Stale Circuits , vol.35 , Issue.88 , pp. 1227-1230
    • Shin, J.1    Chung, I.2    Park, Y.J.3    Min, H.S.4
  • 11
    • 84983421510 scopus 로고
    • Analysis and dedesign of a charge pump circuit for high output current applications
    • Lille (France). Sep
    • G. Van Steenwijk, K. Hoen, and H. Wallinga, " Analysis and dedesign of a charge pump circuit for high output current applications", Proc. ESSCIRC, Lille (France). Sep. 1995. pp. 118-121
    • (1995) Proc. ESSCIRC , pp. 118-121
    • Van Steenwijk, G.1    Hoen, K.2    Wallinga, H.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.