Data compression for multiple scan chains using dictionaries with corrections

Proceedings - International Test Conference

Volumn , Issue , 2004, Pages 926-935

  Würtenberger, Armin ^a   Tautermann, Christofer S ^a   Hellebrand, Sybille ^a  

^a UNIVERSITY OF INNSBRUCK   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

BUILT-IN SELF TEST; COMPUTER AIDED DESIGN; COMPUTER SIMULATION; ENCODING (SYMBOLS); GLOSSARIES; MATHEMATICAL MODELS; MICROPROCESSOR CHIPS; REAL TIME SYSTEMS;

SCAN CHAINS; STRUCTURAL INFORMATION; SYSTEM ON CHIPS (SOC); TEST RESOURCE PARTITIONING (TRP);

DATA COMPRESSION;

EID: 18144408774     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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