Application of deterministic logic BIST on industrial circuits

IEEE International Test Conference (TC)

Volumn , Issue , 2000, Pages 105-114

  Kiefer, Gundolf ^a   Vranken, Harald ^b   Marinissen, Erik Jan ^b   Wunderlich, Hans Joachim ^a  

^a UNIVERSITY OF STUTTGART   (Germany)

^b PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED DESIGN; COMPUTER HARDWARE; GATES (TRANSISTOR); INTEGRATED CIRCUIT TESTING; LOGIC CIRCUITS; SHIFT REGISTERS;

CIRCUIT UNDER TEST; INDUSTRIAL CIRCUITS;

BUILT-IN SELF TEST;

EID: 0034476155     PISSN: 10893539     EISSN: None     Source Type: Journal    
DOI: 10.1109/TEST.2000.894197     Document Type: Article

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