Atomic probes: A search for conduction through a single molecule

Nanotechnology

Volumn 7, Issue 4, 1996, Pages 409-411

  Muller, C J ^a,c   Vleeming, B J ^a,d   Reed, M A ^a   Lamba, J J S ^b   Hara, R ^b   Jones II, L ^b   Tour, J M ^b  

^a Yale University   (United States)

^b UNIVERSITY OF SOUTH CAROLINA   (United States)

^c NXP SEMICONDUCTORS   (Netherlands)

^d LEIDEN UNIVERSITY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CONDUCTIVITY; ELECTRIC VARIABLES MEASUREMENT; ELECTRODES; PROBES; SEMICONDUCTOR JUNCTIONS;

MECHANICAL CONTROLLABLE BREAK JUNCTION; MOLECULAR DEPOSITION; SINGLE MOLECULE;

MOLECULES;

EID: 0030365658     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/7/4/019     Document Type: Article

References (10)

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