Dewetting and pattern formation in thin polymer films as investigated in real and reciprocal space

Journal of Physics Condensed Matter

Volumn 15, Issue 36, 2003, Pages

  Müller Buschbaum, Peter ^a  

^a TECHNICAL UNIVERSITY OF MUNICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; COMPUTER SIMULATION; INTERFACES (MATERIALS); OPTICAL MICROSCOPY; PLASTIC FILMS; POLYSTYRENES; SILICON; SILICONES; SUBSTRATES; SURFACE ROUGHNESS; SURFACE TREATMENT; WETTING;

DEWETTING; PATTERN FORMATION; POLYMER FILM; SCANNING FORCE MICROSCOPY;

THIN FILMS;

EID: 0141843498     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/15/36/201     Document Type: Review

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