메뉴 건너뛰기




Volumn 31, Issue 11, 1998, Pages 3686-3692

Correlated roughness, long-range correlations, and dewetting of thin polymer films

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ELECTROMAGNETIC WAVE SCATTERING; GLASS TRANSITION; MOLECULAR WEIGHT; MORPHOLOGY; POLYSTYRENES; SILICON; SOLVENTS; SURFACE ROUGHNESS; SURFACE TREATMENT; THERMAL EFFECTS; THIN FILMS;

EID: 0032474344     PISSN: 00249297     EISSN: None     Source Type: Journal    
DOI: 10.1021/ma971486f     Document Type: Article
Times cited : (108)

References (48)
  • 14
    • 85034488192 scopus 로고
    • Bowden, M. J., Turner, S. R., Eds.; ACS Symposium Series: Washington, DC
    • Jenekhe, S. A. In Polymers for High Technology; Bowden, M. J., Turner, S. R., Eds.; ACS Symposium Series: Washington, DC, 1987; Vol. 346.
    • (1987) Polymers for High Technology , vol.346
    • Jenekhe, S.A.1
  • 20
    • 0004204007 scopus 로고
    • Martinus Nijhoff Publishers: Dodrecht, The Netherlands
    • Lekner, J. In Theory of Reflection; Martinus Nijhoff Publishers: Dodrecht, The Netherlands, 1987.
    • (1987) Theory of Reflection
    • Lekner, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.