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Volumn 248, Issue 1-4, 1998, Pages 229-237

Dewetting of thin polymer films: An X-ray scattering study

Author keywords

Dewetting; Diffuse scattering; Polymer; SFM

Indexed keywords

ELECTROMAGNETIC WAVE SCATTERING; MORPHOLOGY; NANOSTRUCTURED MATERIALS; POLYSTYRENES; SILICON; SURFACE STRUCTURE; THIN FILMS; X RAY ANALYSIS;

EID: 0032093578     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(98)00238-5     Document Type: Article
Times cited : (37)

References (31)
  • 13
    • 0004204007 scopus 로고
    • Martinus Nijhoff Publishers, Dodrecht
    • J. Lekner, Theory of Reflection, Martinus Nijhoff Publishers, Dodrecht, 1987.
    • (1987) Theory of Reflection
    • Lekner, J.1
  • 24
    • 0346949163 scopus 로고    scopus 로고
    • Digital Inc., Santa Barbara, CA, USA
    • Digital Inc., Santa Barbara, CA, USA.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.