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Volumn 15, Issue 1, 2003, Pages
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Correlated dewetting patterns in thin polystyrene films
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
COMPUTER SIMULATION;
SILICA;
THIN FILMS;
WETTING;
CORRELATED DEWETTING PATTERNS;
DEWETTING;
SATELLITE HOLES;
SILICON OXIDE WAFERS;
THIN POLYSTYRENE FILMS;
POLYSTYRENES;
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EID: 0037439889
PISSN: 09538984
EISSN: None
Source Type: Journal
DOI: 10.1088/0953-8984/15/1/358 Document Type: Article |
Times cited : (28)
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References (28)
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