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Volumn 15, Issue 1, 2003, Pages

Correlated dewetting patterns in thin polystyrene films

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; SILICA; THIN FILMS; WETTING;

EID: 0037439889     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/15/1/358     Document Type: Article
Times cited : (28)

References (28)
  • 26
    • 0012949484 scopus 로고    scopus 로고
    • Manuscript in preparation
    • Manuscript in preparation


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.