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Volumn 34, Issue 14, 2001, Pages 4669-4672

The critical role of solvent evaporation on the roughness of spin-cast polymer films [1]

Author keywords

[No Author keywords available]

Indexed keywords

CASTING; CONTACT ANGLE; EVAPORATION; HYDROPHOBICITY; SILICON WAFERS; SOLVENTS; SURFACE ROUGHNESS;

EID: 0035800272     PISSN: 00249297     EISSN: None     Source Type: Journal    
DOI: 10.1021/ma001440d     Document Type: Letter
Times cited : (223)

References (20)
  • 20
    • 0006343361 scopus 로고    scopus 로고
    • note


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.