Determination of micrometer length scales with an X-ray reflection ultra small-angle scattering set-up

Europhysics Letters

Volumn 42, Issue 5, 1998, Pages 517-522

  Muller Buschbaum P ^a   Casagrande, M ^a   Gutmann, J ^a   Kuhlmann, T ^a   Stamm, M ^a   Von Krosigk, G ^b   Lode, U ^b   Cunis, S ^b   Gehrke, R ^c  

^a MAX PLANCK INSTITUTE FOR POLYMER RESEARCH   (Germany)

^b UNIVERSITY OF ULM   (Germany)

^c DESY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0039390035     PISSN: 02955075     EISSN: None     Source Type: Journal    
DOI: 10.1209/epl/i1998-00282-0     Document Type: Article

References (22)

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