Hierarchical pattern formation in thin film diblock copolymers above the order-disorder transition temperature

Macromolecules

Volumn 32, Issue 24, 1999, Pages 8167-8172

  Limary, R ^a   Green, P F ^a  

^a The University of Texas at Austin   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MORPHOLOGY; ORDER DISORDER TRANSITIONS; SILICON; STRUCTURE (COMPOSITION); SURFACE TOPOGRAPHY; TEMPERATURE; THICKNESS MEASUREMENT; THIN FILMS;

BICONTINUOUS SPINODAL PATTERN; POLYMERIC LIQUID DROPLET; SPREADING COEFFICIENT;

BLOCK COPOLYMERS;

EID: 0033317389     PISSN: 00249297     EISSN: None     Source Type: Journal    
DOI: 10.1021/ma9906074     Document Type: Article

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