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Volumn 34, Issue 11, 2001, Pages 3741-3747
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Leveling and dewetting processes of nanoindentation-induced defects on thin polymer films
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Author keywords
[No Author keywords available]
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Indexed keywords
POLYMER FILMS;
ANNEALING;
ATOMIC FORCE MICROSCOPY;
CRYSTAL DEFECTS;
GLASS TRANSITION;
INDENTATION;
MOLECULAR WEIGHT;
POLYSTYRENES;
RESIDUAL STRESSES;
SEMICONDUCTING SILICON;
THIN FILMS;
PLASTIC FILMS;
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EID: 0035933252
PISSN: 00249297
EISSN: None
Source Type: Journal
DOI: 10.1021/ma001762h Document Type: Article |
Times cited : (10)
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References (21)
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