Control of polystyrene film dewetting through sulfonation and metal complexation

Macromolecules

Volumn 31, Issue 2, 1998, Pages 484-493

  Feng, Yi ^a   Karim, Alamgir ^b   Weiss, Robert A ^a   Douglas, Jack F ^b   Han, Charles C ^b  

^a UNIVERSITY OF CONNECTICUT   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPLEXATION; ELECTROSTATICS; IONOMERS; LITHIUM; OPTICAL MICROSCOPY; POLYSTYRENES; SILICON COMPOUNDS; SULFONATION; SURFACE PHENOMENA; ZINC;

DEWETTING; SILICON OXIDE; X RAY REFLECTIVITY;

PLASTIC FILMS;

EID: 0031647145     PISSN: 00249297     EISSN: None     Source Type: Journal    
DOI: 10.1021/ma9706541     Document Type: Article

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