Van der Waals stable thin liquid films: Correlated undulations and ultimate dewetting

Europhysics Letters

Volumn 44, Issue 4, 1998, Pages 484-490

  Kerle, T ^a   Yerushalmi Rozen, R ^b   Klein, J ^a   Fetters, L J ^c  

^a WEIZMANN INSTITUTE OF SCIENCE   (Israel)

^b BEN GURION UNIVERSITY OF THE NEGEV   (Israel)

^c EXXONMOBIL UPSTREAM RESEARCH COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0032533093     PISSN: 02955075     EISSN: None     Source Type: Journal    
DOI: 10.1209/epl/i1998-00498-4     Document Type: Article

References (17)

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10. Local thickness fluctuations as measured by OPIM, on a length scale of microns, indicate a uniform smooth film. However, we find that, at the sample edges, the thickness may deviate by about 10%.
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16. The value of the Hamaker constant is calculated from the measured value of the refractive index of the PEP oligomer, 1.469, according to the relation given in ISRAELACHVILI J. N., Intermolecular and Surface Forces, 2nd edition (Academic, London) 1992.
17. eff, and Marangoni flows induced by weak thermal gradients at the liquid surface.