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Volumn 14, Issue 4, 1998, Pages 965-969

Thin liquid polymer films rupture via defects

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; MORPHOLOGY; NUCLEATION; POLYMERS; SUBSTRATES; THIN FILMS;

EID: 0032001505     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la970954b     Document Type: Article
Times cited : (283)

References (28)
  • 15
    • 11644293758 scopus 로고    scopus 로고
    • Silanization was necessary since, after careful cleaning of the silicon wafers, polystyrene films did not dewet any more, a fact which is also reported in ref 8
    • Silanization was necessary since, after careful cleaning of the silicon wafers, polystyrene films did not dewet any more, a fact which is also reported in ref 8.
  • 18
    • 11644253654 scopus 로고    scopus 로고
    • The shape of the holes deviates from a circle by less than 2% (difference between small and large half axis)
    • The shape of the holes deviates from a circle by less than 2% (difference between small and large half axis).
  • 26
    • 11644276430 scopus 로고    scopus 로고
    • note
    • 2 gas jet, consisting of a mixture of crystals and gas. Thereby, dust particles remaining from cutting the wafer were safely removed.
  • 27
    • 0017966401 scopus 로고
    • and references therein
    • Stannett, V. J. Membr. Sci. 1978, 3, 97 and references therein.
    • (1978) J. Membr. Sci. , vol.3 , pp. 97
    • Stannett, V.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.