Roughness correlation and interdiffusion in thin films of polymer chains

Journal of Polymer Science, Part B: Polymer Physics

Volumn 37, Issue 20, 1999, Pages 2862-2874

  Kraus, Jürgen ^a   Müller Buschbaum, Peter ^a   Bucknall, David G ^b   Stamm, Manfred ^a  

^a MAX PLANCK INSTITUTE FOR POLYMER RESEARCH   (Germany)

^b RUTHERFORD APPLETON LABORATORY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; GLASS TRANSITION; INTERDIFFUSION (SOLIDS); INTERFACES (MATERIALS); MORPHOLOGY; NEUTRON SCATTERING; POLYSTYRENES; ROUGHNESS MEASUREMENT; SUBSTRATES; SURFACES; THIN FILMS;

DEUTERATED POLYSTYRENE FILM; GLASS SUBSTRATES; ROUGHNESS CORRELATION; THIN POLYMER FILMS;

PLASTIC FILMS;

EID: 0013439428     PISSN: 08876266     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1099-0488(19991015)37:20<2862::AID-POLB6>3.0.CO;2-N     Document Type: Article

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