Self-destruction and dewetting of thin polymer films: The role of interfacial tensions

Journal of Physics Condensed Matter

Volumn 15, Issue 1, 2003, Pages

  Reiter, Günter ^a   Khanna, Rajesh ^a,c   Sharma, Ashutosh ^b  

^a UNIVERSITÉ DE HAUTE ALSACE   (France)

^b INDIAN INSTITUTE OF TECHNOLOGY KANPUR   (India)

^c INDIAN INSTITUTE OF TECHNOLOGY DELHI   (India)

Author keywords

[No Author keywords available]

Indexed keywords

CONTACT ANGLE; OPTICAL MICROSCOPY; SILICON WAFERS; SILICONES; SOLUTIONS; SURFACE ACTIVE AGENTS; SURFACE TENSION; VISCOSITY; WETTING;

DEWETTING; PATTERN FORMATION; POLYMER FILM; SELF-DESTRUCTION;

THIN FILMS;

EID: 0037439752     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/15/1/345     Document Type: Article

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