Ultrahigh density data storage from local polymerization by a scanning tunneling microscope

Applied Physics Letters

Volumn 73, Issue 22, 1998, Pages 3303-3305

  Ma, L P ^a   Yang, W J ^b   Xie, S S ^a   Pang, S J ^a  

^a INSTITUTE OF PHYSICS   (China)

^b PEKING UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; DATA RECORDING; ELECTRIC CONDUCTANCE; ELECTRIC FIELDS; MOLECULAR STRUCTURE; MONOMERS; NANOTECHNOLOGY; POLYMERIZATION; SCANNING TUNNELING MICROSCOPY; SUBSTRATES; THIN FILMS; VAPOR DEPOSITION;

HIGHLY ORDERED PYROLYTIC GRAPHITE; NANOMETER SCALE DATA RECORDING; ULTRAHIGH DENSITY DATA STORAGE; VACUUM EVAPORATION METHOD; VOLTAGE PULSE;

MAGNETIC FILM STORAGE;

EID: 0032583028     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.122752     Document Type: Article

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