Layer-by-layer atomic manipulation on Si(111)-7 × 7 surface: Surface structures and staircase conductance variation with atom removal

Surface Science

Volumn 386, Issue 1-3, 1997, Pages 149-153

  Komeda, T ^a,b   Hasunuma, R ^a   Mukaida, H ^a   Tokumoto, H ^c  

^a JT RES CENTER FOR ATOM TECHNOLOGY   (Japan)

^b Texas Instruments Japan Ltd   (Japan)

^c NATL INST FOR ADV INTERDISC RES   (Japan)

Author keywords

Electrical transport measurements; Field emission; Scanning tunneling microscopy; Surface electrical transport; Surface structure

Indexed keywords

CHARGE CARRIERS; CRYSTAL ATOMIC STRUCTURE; POINT CONTACTS; SCANNING TUNNELING MICROSCOPY; STACKING FAULTS; SUBSTRATES; SURFACE STRUCTURE;

DIMER ADATOM STACKING FAULT (DAS) MODEL;

SEMICONDUCTING SILICON;

EID: 0031248076     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(97)00323-3     Document Type: Article

References (15)

1. P. Avouris (Ed.), Atomic and nanometer-scale modification of materials: fundamentals and applications, NATO ASI Series E239, Kluwer, Dordrecht, 1993.
2. I.-W. Lyo, P. Avouris, Science 253 (1991) 173.
3. Ph. Avouris, I.-W. Lyo, Y. Hasegawa, J. Vac. Sci. Technol. A 11 (1993) 1725.
4. H. Uchida, D. Huang, F. Grey, M. Aono, Phys. Rev. Lett. 70 (1990) 2040.
5. A. Kobayashi, F. Grey, R.S. Williams, M. Aono, Science 259 (1993) 1724.
6. M. Aono, A. Kobayashi, F. Grey, H. Uchida, D. Huang, Jap. J. Appl. Phys. 32 (1993) 1470.
7. T. Komeda, R. Hasunuma, H. Mukaida, H. Tokumoto, Appl. Phys. Lett. 68 (1996) 3482.
8. R. Hasunuma, T. Komeda, H. Mukaida, H. Tokumoto, J. Vac. Sci. Technol., to be publushed.
9. J.I. Pascual, J. Mendez, J. Gomez-Herrero, A.M. Baro N. Garcia, Phys. Rev. Lett. 71 (1993) 1852; J.I. Pascual, J. Mendez, J. Gomez-Herrero, A.M. Baro, N. Garcia, U. Landman, W.D. Luedke, E.N. Bigachek, H.-P. Cheng, Science 267 (1995) 1995.
10. J.I. Pascual, J. Mendez, J. Gomez-Herrero, A.M. Baro N. Garcia, Phys. Rev. Lett. 71 (1993) 1852; J.I. Pascual, J. Mendez, J. Gomez-Herrero, A.M. Baro, N. Garcia, U. Landman, W.D. Luedke, E.N. Bigachek, H.-P. Cheng, Science 267 (1995) 1995.
11. H.J. Mamin, D. Ruger, Phys. Rev. Lett. 72 (1994) 1128.
12. A. Ohi, W. Mizutani, H. Tokumoto, J. Vac. Sci. Technol. B 13 (1995) 1252.
13. D.P.E. Smith, Science 269 (1995) 371.
14. U. Landman, W.D. Luedke, B.E. Salisbury, R.L. Whetten, Phys. Rev. Lett. 77 (1996) 1362.
15. E. Tekman, S. Ciraci, Phys. Rev. B 43 (1991) 7145.