Laser-induced thermal expansion of a scanning tunneling microscope tip measured with an atomic force microscope cantilever

Applied Physics Letters

Volumn 73, Issue 17, 1998, Pages 2521-2523

  Huber, R ^a   Koch, M ^a   Feldmann, J ^a  

^a UNIVERSITY OF MUNICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000445017     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.122502     Document Type: Article

References (17)

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13. Note, that the rise time as well as the maximum current are limited by the current amplifier.
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16. To verify that the expansion is not an artifact caused, e.g., by thermally induced bending of the cantilever we have replaced the STM tip by a glass tip which does not absorb light at 800 nm. We do not observe any tip expansion in this case.
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