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Volumn 81, Issue 25, 1998, Pages 5572-5575
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Field-induced deformation as a mechanism for scanning tunneling microscopy based nanofabrication
a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0001510757
PISSN: 00319007
EISSN: 10797114
Source Type: Journal
DOI: 10.1103/PhysRevLett.81.5572 Document Type: Article |
Times cited : (33)
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References (27)
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