Current characteristics in near field emission scanning tunneling microscopes

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 14, Issue 4, 1996, Pages 2403-2406

  Saenz J J ^a  

^a UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 24644449323     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (14)

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