A closed-loop evaluation and validation of a method for determining the dependence of the electron mobility on the longitudinal-electric field in mosfet's

IEEE Transactions on Electron Devices

Volumn 44, Issue 9, 1997, Pages 1447-1453

  Roldan J B ^a   Gamiz F ^a   Lopez Villanueva J A ^a  

^a UNIVERSITY OF GRANADA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC FIELDS; MONTE CARLO METHODS; SEMICONDUCTOR DEVICE MODELS;

ELECTRON MOBILITY;

MOSFET DEVICES;

EID: 0031234006     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.622600     Document Type: Article

References (29)

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