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Journal of Applied Physics

Volumn 54, Issue 3, 1983, Pages 1445-1456

High-field drift velocity of electrons at the Si-SiO2 interface as determined by a time-of-flight technique

(2) Cooper, J A a Nelson, D F a

a LUCENT TECHNOLOGIES (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTOR DEVICES;

EID: 0020717155 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.332170 Document Type: Article

Times cited : (119)

References (21)

1
- 0014749359
- (1970) J. Appl. Phys , vol.41 , pp. 1825
- Fang, F.F.¹ Fowler, A.B.²

2
- 3042741841
- (1971) J. Phys. Soc. Jpn , vol.31 , pp. 1846
- Sato, T.¹ Takeishi, Y.² Tango, H.³ Ohonama, H.⁴ Okamato, Y.⁵

3
- 0019016615
- (1980) Solid State Commun , vol.34 , pp. 447
- Muller, W.¹ Eisele, I.²

4
- 0018960654
- (1980) Solid‐State Electron , vol.23 , pp. 35
- Coen, R.W.¹ Muller, R.S.²

5
- 84952284330
- Jr. and D. F. Nelson, IEEE Device Research Conference, June, Ithaca, New York.
- (1980)
- Cooper, J.A.¹

6
- 0019584636
- (1981) IEEE Electron Device Lett , vol.EDL‐2 , pp. 171
- Cooper, J.A.¹ Nelson, D.F.²

7
- 49049135136
- (1982) Surf. Sci , vol.113 , pp. 267
- Nelson, D.F.¹ Cooper, J.A.²

8
- 0003879668
- (Wiley, New York, ),
- (1967) Physics and Technology of Semiconductor Devices , pp. 293-296
- Grove, A.S.¹

9
- 84914966737
- (1967) IEEE Trans. Electron Devices , vol.ED‐14 , pp. 38
- Norris, C.B.¹ Gibbons, J.F.²

10
- 0003537065
- in, edited by D. K. Ferry, J. R. Barker, and C. Jacoboni.(Plenum, New York)
- (1980) Physics of Nonlinear Transport in Semiconductors
- Reggiani, L.¹

11
- 84952289764
- IEEE IEDM Tech. Digest.
- (1979) , vol.18
- Sabnis, A.G.¹ Clemens, J.T.²

12
- 0003421824
- .(Wiley, New York)
- (1960) Finite Difference Methods for Partial Differential Equations
- Forsythe, G.E.¹ Wasow, W.R.²

13
- 84937647369
- (1950) Proc. IRE , vol.40 , pp. 1365
- Shockley, W.¹

14
- 0020164211
- (1982) J. Appl. Phys , vol.53 , pp. 5013
- Nelson, D.F.¹

15
- 0015640011
- (1973) IEEE J. Solid‐State Circuits , vol.SC‐8 , pp. 191
- Mohsen, A.M.¹ McGill, T.C.² Mead, C.A.³

16
- 0345409557
- (1981) Appl. Phys. Lett , vol.39 , pp. 843
- Thornber, K.K.¹ Nelson, D.F.² Cooper, J.A.³

17
- 23544450461
- (1982) Phys. Rev. B , vol.25 , pp. 5267
- Nelson, D.F.¹

18
- 0019048875
- (1980) IEEE Trans. Electron Devices , vol.ED‐27 , pp. 1497
- Sun, S.C.¹ Plummer, J.D.²

19
- 0019003692
- (1980) J. Appl. Phys , vol.51 , pp. 2127
- Thornber, K.K.¹

20
- 84952284332
- IEEE Device Research Conference, June, Fort Collins, Colorado.
- (1982)
- Schwarz, S.A.¹ Russek, S.E.²

21
- 0000693505
- (1975) Phys. Rev , vol.12 , pp. 2265
- Canali, C.¹ Jacoboni, C.² Ottaviani, N.G.³ Alberigi‐Quaranta, A.⁴

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.