A Closed-Loop Evaluation and Validation of a Method for Determining the Scattering Limited Carrier Velocity in MOSFET’s

IEEE Transactions on Electron Devices

Volumn 37, Issue 11, 1990, Pages 2388-2394

  Lee, Shiuh Wuu ^a   Chan, Tung Yi ^a  

^a INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTOR MATERIALS - CHARGE CARRIERS;

TRANSCONDUCTANCE;

SEMICONDUCTOR DEVICES, MOSFET;

EID: 0025516911     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/16.62297     Document Type: Article

References (22)

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