Microbeam analysis of MOS circuits

First European Conference on Radiation and Its Effects on Devices and Systems - RADECS 91

Volumn , Issue , 1992, Pages 435-439

  McNulty, P J ^a   Beauvais, W J ^a   Roth, D R ^a   Lynch, J E ^a  

^a CLEMSON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTRIC LINES; MOS DEVICES; RANDOM ACCESS STORAGE; SEMICONDUCTOR JUNCTIONS; TRANSISTORS;

HEAVY IONS; MICROBEAM ANALYSIS; MOS SRAM; PULSE HEIGHT ANALYSIS;

RADIATION EFFECTS;

EID: 0026977696     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)