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Volumn 33, Issue 6, 1986, Pages 1651-1656

An approach to measure ultrafast-funneling-current transients

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0038467182     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/TNS.1986.4334658     Document Type: Article
Times cited : (9)

References (9)
  • 1
    • 0020312672 scopus 로고
    • Charge Funneling in N and P-Type Substrates
    • F. B. McLean and T. R. Oldham, “Charge Funneling in N and P-Type Substrates,” IEEE Transactions on Nuclear Science, Vol. NS-29, pp. 2018–2023, 1982.
    • (1982) IEEE Transactions on Nuclear Science , vol.NS-29 , pp. 2018-2023
    • McLean, F.B.1    Oldham, T.R.2
  • 2
    • 0020298427 scopus 로고
    • Collection of Charge on Junction Nodes from Ion Tracks
    • G. C. Messenger. “Collection of Charge on Junction Nodes from Ion Tracks,” IEEE Transactions on Nuclear Science, Vol. NS-29, pp. 2024–2029, 1982.
    • (1982) IEEE Transactions on Nuclear Science , vol.NS-29 , pp. 2024-2029
    • Messenger, G.C.1
  • 3
    • 0022200465 scopus 로고
    • Characteristics of SEU Current Transients and Collected Charge in GaAs and Si Devices
    • Z. Schanfield, M. M. Moriwaki, W. H. Digby, and J. R. Srour, “Characteristics of SEU Current Transients and Collected Charge in GaAs and Si Devices,” IEEE Transactions on Nuclear Science, Vol. NS-32, 1985, pp. 4104–4109.
    • (1985) IEEE Transactions on Nuclear Science , vol.NS-32 , pp. 4104-4109
    • Schanfield, Z.1    Moriwaki, M.M.2    Digby, W.H.3    Srour, J.R.4
  • 4
    • 0020765547 scopus 로고
    • Collection of Charge from Alpha-Particle Particle Tracks in Silicon Devices
    • Chang-Ming Hsieh, Philip C. Murley, and Redmond R. O'Brien, “Collection of Charge from Alpha-Particle Particle Tracks in Silicon Devices,” IEEE Transactions on Electron Devices, Vol. ED-30, pp. 686–693, 1983.
    • (1983) IEEE Transactions on Electron Devices , vol.ED-30 , pp. 686-693
    • Hsieh, C.-M.1    Murley, P.C.2    O'Brien, R.R.3
  • 5
    • 0016343944 scopus 로고
    • Precision Picosecond-Pulse Measurements Using a High-Quality Superconducting Delay Line
    • James R. Andrews, “Precision Picosecond-Pulse Measurements Using a High-Quality Superconducting Delay Line,” IEEE Transactions on Instrumentation and Measurement, Vol. IM-23, pp. 468–472, 1974.
    • (1974) IEEE Transactions on Instrumentation and Measurement , vol.IM-23 , pp. 468-472
    • Andrews, J.R.1
  • 7
    • 0022204209 scopus 로고
    • Effects of single neutron interactions in silicon integrated circuits
    • Joseph R. Srour and R. A. Hartmann, “Effects of single neutron interactions in silicon integrated circuits,” IEEE Trans. Nuc. Sci., NS-32, 1985, pp. 4195–4200.
    • (1985) IEEE Trans. Nuc. Sci , vol.NS-32 , pp. 4195-4200
    • Srour, J.R.1    Hartmann, R.A.2
  • 8
    • 0018679176 scopus 로고
    • An Approximate Dispersion Formula of Microstrip Lines for Computer Aided Design of Microwave Integrated Circuits
    • E. Yamashita, K. Atsuki, and T. Ueda, “An Approximate Dispersion Formula of Microstrip Lines for Computer Aided Design of Microwave Integrated Circuits,” IEEE Trans. Microwave Theory Tech., Vol. MTT-27, pp 1036–1038, 1979.
    • (1979) IEEE Trans. Microwave Theory Tech , vol.MTT-27 , pp. 1036-1038
    • Yamashita, E.1    Atsuki, K.2    Ueda, T.3
  • 9
    • 0022137463 scopus 로고
    • Polycrystalline-Silicon Integrated Photoconductors for Picosecond Pulsing and Gating
    • D. R. Bowman, R. B. Hammond, and R. W. Dutton, “Polycrystalline-Silicon Integrated Photoconductors for Picosecond Pulsing and Gating,” IEEE Electron Device Letters, Vol. EDL-6, pp. 502–504, 1985.
    • (1985) IEEE Electron Device Letters , vol.EDL-6 , pp. 502-504
    • Bowman, D.R.1    Hammond, R.B.2    Dutton, R.W.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.