Nuclear microprobes and their significance for trace element analysis

Nuclear Inst. and Methods in Physics Research, A

Volumn 268, Issue 2-3, 1988, Pages 567-578

  Traxel, Kurt ^a  

^a UNIVERSITY OF HEIDELBERG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

MICROSCOPIC EXAMINATION; PARTICLE BEAMS; X-RAYS - SPECTRUM ANALYSIS;

ELEMENTAL ANALYSIS; NUCLEAR MICROPROBES; PIXE; TRACE ELEMENTS;

MICROANALYSIS;

EID: 0024012628     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-9002(88)90580-3     Document Type: Article

References (71)

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3. Proc. Int. Conf. Particle Induced X-ray Emission and its Analytical Applications I–IV
4. Proc. Int. Conf. Particle Induced X-ray Emission and its Analytical Applications I–IV
5. Proc. Int. Conf. Particle Induced X-ray Emission and its Analytical Applications I–IV
6. Corrected electrostatic lens systems for ion beams
7. Collimation of ion beams to micrometer dimensions
8. The scanning heavy ion microscope at GSI
9. The Studsvik nuclear microprobe — Developments and applications
10. RBS analysis with a 1 μ beam
11. The nuclear microprobe and its applications to controlled fusion research
12. Determination of lateral trace element distributions with the bochum proton microprobe
13. Progress in Space Charge Lens Development
14. Compensation of Aberrations in Achromatic Quadrupole Doublets
15. A review and preview of proton microprobes
16. Magazine for electron microscopists
17. Hamburger SynchrotronStrahlungslabor HASYLAB