Charge collection in test structures

IEEE Transactions on Nuclear Science

Volumn 30, Issue 6, 1983, Pages 4486-4492

  Campbell, A B ^a   Knudson, A R ^a   Shapiro, I P ^a   Patterson, D O ^a   Seiberling, L E ^b  

^a NAVAL RESEARCH LABORATORY   (United States)

^b UNIVERSITY OF PENNSYLVANIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTING SILICON;

INTEGRATED CIRCUITS;

EID: 0020904494     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/TNS.1983.4333159     Document Type: Article

References (18)

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