-
1
-
-
0022876419
-
An Approach to Measure Ultra-Fast Funneling Current Transients
-
December
-
R. S. Wagner, J. M. Bradley, C. J. Maggiore, J. G. Beery, and R. B. Hammond, “An Approach to Measure Ultra-Fast Funneling Current Transients,” IEEE Transactions on Nuclear Science, Vol. NS-33, No. 6, 1651–1655 (December 1986).
-
(1986)
IEEE Transactions on Nuclear Science
, vol.NS-33
, Issue.6
, pp. 1651-1655
-
-
Wagner, R.S.1
Bradley, J.M.2
Maggiore, C.J.3
Beery, J.G.4
Hammond, R.B.5
-
2
-
-
0041792978
-
Transient Measurements of Ultra-Fast Charge Collection in Semiconductor Diodes
-
December
-
R. S. Wagner, J. M. Bradley, Nicole Bordes, D. N. Sinha, C. J. Maggiore, and R. B.Hammond, “Transient Measurements of Ultra-Fast Charge Collection in Semiconductor Diodes,” IEEE Transactions on Nuclear Science, Vol. NS-34, No. 6, 1640–1245 (December 1987).
-
(1987)
IEEE Transactions on Nuclear Science
, vol.NS-34
, Issue.6
, pp. 1245-1640
-
-
Wagner, R.S.1
Bradley, J.M.2
Bordes, N.3
Sinha, D.N.4
Maggiore, C.J.5
Hammond, R.B.6
-
3
-
-
77957233598
-
Charge Collection Efficiency Related to Damage in MOS Capacitors
-
December
-
M. A. Xapsos, A. B. Campbell, A. R. Knudson, W. J. Stapor, P. Shapiro, V. Palmer, T. T. McDonald, S. L. Swickert, “Charge Collection Efficiency Related to Damage in MOS Capacitors,” IEEE Transactions on Nuclear Science, Vol. NS-34, No. 6, 1214–1219 (December 1987).
-
(1987)
IEEE Transactions on Nuclear Science
, vol.NS-34
, Issue.6
, pp. 1214-1219
-
-
Xapsos, M.A.1
Campbell, A.B.2
Knudson, A.R.3
Stapor, W.J.4
Shapiro, P.5
Palmer, V.6
McDonald, T.T.7
Swickert, S.L.8
-
4
-
-
0022865248
-
Revised Funnel Calculations for Heavy Particles with High LET
-
December
-
T. R. Oldham, F. B. McLean, and J. M. Hartman, “Revised Funnel Calculations for Heavy Particles with High LET,” IEEE Transactions on Nuclear Science, Vol. NS-33, No.6, 1646–1650 (December 1986).
-
(1986)
IEEE Transactions on Nuclear Science
, vol.NS-33
, Issue.6
, pp. 1646-1650
-
-
Oldham, T.R.1
McLean, F.B.2
Hartman, J.M.3
-
5
-
-
0021635966
-
Charge Collection in N-Type GaAs Schottky-Barrier Diodes Struck by Heavy Energetic Ions
-
December
-
R. M. Gilbert, G. K. Ovrebo, J. Schifano, and T. R. Oldham, “Charge Collection in N-Type GaAs Schottky-Barrier Diodes Struck by Heavy Energetic Ions,” IEEE Transactions on Nuclear Science, Vol. NS-31, No.6, 1570–1573 (December 1984).
-
(1984)
IEEE Transactions on Nuclear Science
, vol.NS-31
, Issue.6
, pp. 1570-1573
-
-
Gilbert, R.M.1
Ovrebo, G.K.2
Schifano, J.3
Oldham, T.R.4
-
6
-
-
84939061354
-
Plasma Screening of Funnel Fields
-
December
-
R. M. Gilbert, G. K. Ovrebo, and J. Schifano, “Plasma Screening of Funnel Fields,” IEEE Transactions on Nuclear Science, Vol. NS-32, No. 6, 4098–4103 (December 1985).
-
(1985)
IEEE Transactions on Nuclear Science
, vol.NS-32
, Issue.6
, pp. 4098-4103
-
-
Gilbert, R.M.1
Ovrebo, G.K.2
Schifano, J.3
-
7
-
-
55249089626
-
Charge Funnelling in N and P-Type Si Substrates
-
December
-
F. B. McLean, T. R. Oldham, “Charge Funnelling in N and P-Type Si Substrates,” III Transactions on Nuclear Science, Vol. NS-29, No. 6, 2018–2023 (December 1982).
-
(1982)
III Transactions on Nuclear Science
, vol.NS-29
, Issue.6
, pp. 2018-2023
-
-
McLean, F.B.1
Oldham, T.R.2
-
8
-
-
0020952139
-
Charge Collection Measurements for Heavy Ions Incident on N and P-Type Silicon
-
December
-
T. R. Oldham, F. B. McLean, “Charge Collection Measurements for Heavy Ions Incident on N and P-Type Silicon,” IEEE Transactions on Nuclear Science, Vol. NS-30, No. 6, 4493–4500 (December 1983).
-
(1983)
IEEE Transactions on Nuclear Science
, vol.NS-30
, Issue.6
, pp. 4493-4500
-
-
Oldham, T.R.1
McLean, F.B.2
-
9
-
-
84939328568
-
Techniques for Minimizing Soft Error Upset Rate for Large Scale Integrated Circuits
-
Doctoral Thesis February
-
G. C. Messenger, “Techniques for Minimizing Soft Error Upset Rate for Large Scale Integrated Circuits,” Doctoral Thesis (February 1987).
-
(1987)
-
-
Messenger, G.C.1
-
10
-
-
0020091827
-
Alpha-Particle-Induced Field and Enhanced Collection of Carriers
-
February
-
C. Hu, “Alpha-Particle-Induced Field and Enhanced Collection of Carriers,” IEEE Electron Device Letters, Vol. EDL-3, No. 2, 31–34 (February 1982).
-
(1982)
IEEE Electron Device Letters
, vol.EDL-3
, Issue.2
, pp. 31-34
-
-
Hu, C.1
-
11
-
-
0019707564
-
Dynamics of Charge Collection from Alpha Particle Tracks in Integrated Circuits
-
Orlando, FL, April 7
-
C. M. Hsieh, P. C. Murley, R. R. O'Brien, “Dynamics of Charge Collection from Alpha Particle Tracks in Integrated Circuits,” Proc. of IEEE 19th Annual International Reliability Physics Symposium, 38, Orlando, FL, April 7, 1981.
-
(1981)
Proc. of IEEE 19th Annual International Reliability Physics Symposium
, vol.38
-
-
Hsieh, C.M.1
Murley, P.C.2
O'Brien, R.R.3
|