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Volumn 35, Issue 6, 1988, Pages 1578-1584

Alpha-, boron-, silicon- and iron- ion-induced current transients in low-capacitance silicon and GaAs diodes

Author keywords

[No Author keywords available]

Indexed keywords

BORON; ION BEAMS; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING SILICON;

EID: 0024169725     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.25501     Document Type: Article
Times cited : (48)

References (11)
  • 4
    • 0022865248 scopus 로고
    • Revised Funnel Calculations for Heavy Particles with High LET
    • December
    • T. R. Oldham, F. B. McLean, and J. M. Hartman, “Revised Funnel Calculations for Heavy Particles with High LET,” IEEE Transactions on Nuclear Science, Vol. NS-33, No.6, 1646–1650 (December 1986).
    • (1986) IEEE Transactions on Nuclear Science , vol.NS-33 , Issue.6 , pp. 1646-1650
    • Oldham, T.R.1    McLean, F.B.2    Hartman, J.M.3
  • 5
    • 0021635966 scopus 로고
    • Charge Collection in N-Type GaAs Schottky-Barrier Diodes Struck by Heavy Energetic Ions
    • December
    • R. M. Gilbert, G. K. Ovrebo, J. Schifano, and T. R. Oldham, “Charge Collection in N-Type GaAs Schottky-Barrier Diodes Struck by Heavy Energetic Ions,” IEEE Transactions on Nuclear Science, Vol. NS-31, No.6, 1570–1573 (December 1984).
    • (1984) IEEE Transactions on Nuclear Science , vol.NS-31 , Issue.6 , pp. 1570-1573
    • Gilbert, R.M.1    Ovrebo, G.K.2    Schifano, J.3    Oldham, T.R.4
  • 7
    • 55249089626 scopus 로고
    • Charge Funnelling in N and P-Type Si Substrates
    • December
    • F. B. McLean, T. R. Oldham, “Charge Funnelling in N and P-Type Si Substrates,” III Transactions on Nuclear Science, Vol. NS-29, No. 6, 2018–2023 (December 1982).
    • (1982) III Transactions on Nuclear Science , vol.NS-29 , Issue.6 , pp. 2018-2023
    • McLean, F.B.1    Oldham, T.R.2
  • 8
    • 0020952139 scopus 로고
    • Charge Collection Measurements for Heavy Ions Incident on N and P-Type Silicon
    • December
    • T. R. Oldham, F. B. McLean, “Charge Collection Measurements for Heavy Ions Incident on N and P-Type Silicon,” IEEE Transactions on Nuclear Science, Vol. NS-30, No. 6, 4493–4500 (December 1983).
    • (1983) IEEE Transactions on Nuclear Science , vol.NS-30 , Issue.6 , pp. 4493-4500
    • Oldham, T.R.1    McLean, F.B.2
  • 9
    • 84939328568 scopus 로고
    • Techniques for Minimizing Soft Error Upset Rate for Large Scale Integrated Circuits
    • Doctoral Thesis February
    • G. C. Messenger, “Techniques for Minimizing Soft Error Upset Rate for Large Scale Integrated Circuits,” Doctoral Thesis (February 1987).
    • (1987)
    • Messenger, G.C.1
  • 10
    • 0020091827 scopus 로고
    • Alpha-Particle-Induced Field and Enhanced Collection of Carriers
    • February
    • C. Hu, “Alpha-Particle-Induced Field and Enhanced Collection of Carriers,” IEEE Electron Device Letters, Vol. EDL-3, No. 2, 31–34 (February 1982).
    • (1982) IEEE Electron Device Letters , vol.EDL-3 , Issue.2 , pp. 31-34
    • Hu, C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.