Charge collection measurements for heavy ions incident on n- and p-type silicon

IEEE Transactions on Nuclear Science

Volumn 30, Issue 6, 1983, Pages 4493-4500

  Oldham, T R ^a   McLean, F B ^a  

^a U S ARMY RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COSMIC RAYS; INTEGRATED CIRCUITS - RADIATION EFFECTS;

SEMICONDUCTING SILICON;

EID: 0020952139     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/TNS.1983.4333160     Document Type: Article

References (16)

1. T.C. May and M.H. Woods, IEEE Trans. Electron Dev., ED-26 , 2 (1979).
2. C.M. Hsieh, P.C. Murley, and R.R. O’Brien, IEEE Electron Dev. Lett., EDL-2 , 103 (1981).
3. C.M. Hsieh, P.C. Murley, and R.R. O’Brien, Proc. IEEE Int'l. Reliability Phys. Symposium , p. 38, Orlando, Florida, April 1981.
4. F.B. McLean and T.R. Oldham, IEEE Trans. Nucl. Sci., NS-29 , 2018 (1982).
5. C. Hu, IEEE Electron Dev. Lett., EDL-3 , 31 (1982).
6. G.C. Messenger, IEEE Trans. Nucl. Sci., NS-29 , 2024 (1982).
7. J.F. Ziegler, Handbook of Stopping Cross Sections for Energetic Ions in All Elements, Vol. 5, Pergamon Press, New York, 1980.
8. J. Lindhard, M. Scharff, and H. Schiott, Mat. Fyx. Medd. Vid. Selsk, 33 , No. 14, 1963.
9. B.D. Wilkins, M.J. Fluss, S.B. Kaufman, C.E. Gross and E.P. Steinberg, Nucl. Inst. Meth., 92 , 381 (1971)
10. E.P. Steinberg, S.B. Kaufman, B.D. Wilkins, and C.E. Gross, Nucl. Inst. Meth., 99 , 309 (1972).
11. J.J. Brophy, Basic Electronics for Scientists, McGraw-Hill, New York, 1966.
12. A. Campbell, A. Knudson, P. Shapiro, D. Patterson, and L. Seiberling, Charge Collection in Test Structures, these proceedings.
13. J. Adams, The Variability of Single Event Upset Rates in the Natural Environment, these proceedings.
14. J. Pickel and J. Blandford, Single Event Upset Modeling for Static MOS Memory Cells, DNA Contractors Report (1983).
15. W.A. Kolasinski, R. Koga, J. Blake, and S. Diehl, IEEE Trans. Nucl. Sci., NS 28 , 4013 (1980).
16. T.K. Sanderson, D. Mapper, J. Stephens, J. Farron, J. Srensen, and L. Adams, CosmicRay Simulation Experiments for the Study of Single event Upsets in CMOS Memories, these proceedings.