Single-eventeffect ground test issues

IEEE Transactions on Nuclear Science

Volumn 43, Issue 2 PART 1, 1996, Pages 661-670

  Koga, R ^a  

^a AEROSPACE CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; CHARGED PARTICLES; DIGITAL CIRCUITS; ELECTRONS; ERRORS; ION BEAMS; IONIZATION; IRRADIATION; PARTICLE BEAMS; RADIATION; SPACE APPLICATIONS; TRANSISTORS;

LINEAR ENERGY TRANSFER; PHOTONIC DATA LINK SYSTEMS; PHOTONIC DEVICES; POWER TRANSISTORS; RADIATION BELT PROTONS; SINGLE EVENT BURNOUT; SINGLE EVENT EFFECT TESTING; SINGLE EVENT GATE RUPTURE; SINGLE EVENT LATCHUP; SINGLE EVENT UPSET;

IONS;

EID: 0030128991     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.490909     Document Type: Article

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