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Volumn 40, Issue 6, 1993, Pages 1926-1934

Numerical simulation of heavy ion charge generation and collection dynamics

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; IONS; MATHEMATICAL MODELS; PRODUCT DESIGN; SEMICONDUCTOR DIODES; SEMICONDUCTOR DOPING; TRANSIENTS;

EID: 0027840202     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.273462     Document Type: Article
Times cited : (59)

References (25)
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    • Fu, J.S.1    Axness, C.L.2    Weaver, H.T.3
  • 8
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    • Lateral Charge Transport from Heavy-Ion Tracks in Integrated Circuit Chips
    • J.A. Zoutendyk, H.R. Schwartz, and L.R. Nevill, “Lateral Charge Transport from Heavy-Ion Tracks in Integrated Circuit Chips,” IEEE Transactions on Nuclear Science NS-35, pp 1644–1647 (1988).
    • (1988) IEEE Transactions on Nuclear Science , vol.NS-35 , pp. 1644-1647
    • Zoutendyk, J.A.1    Schwartz, H.R.2    Nevill, L.R.3
  • 9
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    • 4He, 12C, and 63Cu Ions Effect Simulation on Silicon Diode
    • IEEE Press, La Grande-Motte, France, 1991
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    • (1991) RADECS 91 , pp. 419-423
    • Michez, A.1    Bordure, G.2    Patin, Y.3    Gosselin, G.4
  • 10
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    • Comparison of Experimental Charge Collection Waveforms with PISCES Calculations
    • A.R. Knudson and A.B. Campbell, “Comparison of Experimental Charge Collection Waveforms with PISCES Calculations,” IEEE Transactions on Nuclear Science NS-38, pp 1540–1545 (1991).
    • (1991) IEEE Transactions on Nuclear Science , vol.NS-38 , pp. 1540-1545
    • Knudson, A.R.1    Campbell, A.B.2
  • 11
    • 77957223850 scopus 로고
    • Heavy Ion Induced Latch-Up Simulation
    • Techmart Meeting Center, Santa Clara, CA, August 9
    • J.G. Rollins, “Heavy Ion Induced Latch-Up Simulation,” TMA 8th Annual TCAD Seminar, Techmart Meeting Center, Santa Clara, CA, August 9, 1990.
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    • Rollins, J.G.1
  • 12
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    • Numerical Analysis of Alpha-Particle-Induced Soft Errors in SOI MOS Devices
    • H. Iwata and T. Ohzone, “Numerical Analysis of Alpha-Particle-Induced Soft Errors in SOI MOS Devices,” IEEE Transactions on Electron Devices ED-39, pp 1184–1190 (1992).
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  • 16
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  • 20


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.