Dependence of the seu window of vulnerability of a logic circuit on magnitude of deposited charge

IEEE Transactions on Nuclear Science

Volumn 40, Issue 6, 1993, Pages 1853-1857

  Buchner, S ^a   Kang, Keith ^a   Krening, D ^a   Lannan, G ^a   Schneiderwind, R ^a  

^a LOCKHEED MARTIN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC NETWORK ANALYSIS; IONS; LASER PULSES; LIGHT; LOGIC GATES; SEMICONDUCTING GALLIUM ARSENIDE; SIGNAL PROCESSING; TIME MEASUREMENT; TRANSISTORS;

CHARGE COLLECTION; DEPOSITED CHARGE; LINEAR ENERGY TRANSFER; PULSE ENERGY; PULSED PICOSECOND LASER; SIGNAL PROPAGATION; SINGLE EVENT UPSET; WINDOW OF VULNERABILITY;

LOGIC CIRCUITS;

EID: 0027853305     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.273470     Document Type: Article

References (4)

1. S. Buchner, K. Kang, W.J. Stapor, A.B. Campbell, A.R. Knudson, P. McDonald, and S. Rivet, “Pulsed Laser Induced SEU in Integrated Circuits: A Practical Method for Hardness Assurance Testing,” IEEE Trans. Nucl. Sci. NS-37, 1825 (1990).
2. R. Schneiderwind, D. Krening, S. Buchner, K. Kang, and T. Weatherford, “Laser Confirmation of SEU Experiments in GaAs MESFET Combinational Logic,” IEEE Trans. Nucl. Sci. NS-39, 1665 (1992).
3. S. Buchner, K. Karg, W.J. Stapor, and S. Rivet, “Spatial and Temporal Dependence of SEUs in a 64K SRAM,” IEEE Trans. Nucl. Sci. NS-39, 1630 (1992).
4. S. Buchner, K. Kang, D.W. Tu, A.R. Knudson, A.B. Campbell, D. McMorrow, V. Srinivas, and Y.J. Chen, “Charge Collection in GaAs MESFETs and MODFETs,” IEEE Trans. Nocl. Sci. NS-38, 1370 (1991).