-
2
-
-
0026373080
-
Ion Induced Charge Collection in GaAs MESFETs and its Effect on SEU Vulnerability
-
B.W. Hughlock, T. Williams, A.H. Johnston, and R.E. Plaag, “Ion Induced Charge Collection in GaAs MESFETs and its Effect on SEU Vulnerability,” IEEE Trans. Nucl. Sci., NS-38, 1442 (1991).
-
(1991)
IEEE Trans. Nucl. Sci
, vol.NS-38
, pp. 1442
-
-
Hughlock, B.W.1
Williams, T.2
Johnston, A.H.3
Plaag, R.E.4
-
3
-
-
0026407428
-
Proton and Heavy Ion Upsets in GaAs MESFET Devices
-
T.R. Weatherford, L. Tran, W.J. Stapor, E.L. Petersen, J.B. Langworthy, D. McMorrow, W.G. Abdel-Kader, and J.P. McNulty, “Proton and Heavy Ion Upsets in GaAs MESFET Devices,” IEEE Trans. Nucl. Sci., NS-38, 1450 (1991).
-
(1991)
IEEE Trans. Nucl. Sci
, vol.NS-38
, pp. 1450
-
-
Weatherford, T.R.1
Tran, L.2
Stapor, W.J.3
Petersen, E.L.4
Langworthy, J.B.5
McMorrow, D.6
Abdel-Kader, W.G.7
McNulty, J.P.8
-
4
-
-
0025658659
-
Pulsed Laser-Induced SEU in Integrated Circuits: A Practical Method for Hardness Assurance
-
S. Buchner, K. Kang, W.J. Stapor, A.B. Campbell, A.R. Knudson, P. McDonald, and S. Rivet, “Pulsed Laser-Induced SEU in Integrated Circuits: A Practical Method for Hardness Assurance,” IEEE Trans. Nucl. Sci., NS-37, 1825 (1990).
-
(1825)
IEEE Trans. Nucl. Sci
, vol.NS-37
-
-
Buchner, S.1
Kang, K.2
Stapor, W.J.3
Campbell, A.B.4
Knudson, A.R.5
McDonald, P.6
Rivet, S.7
-
5
-
-
0024169257
-
Charge Collection in Silicon for Ions of Different Energy but Same Linear Energy Transfer (LET)
-
W J. Stapor, P.T. McDonald, A.R. Knudson, A.B. Campbell, and B.G. Glagola, “Charge Collection in Silicon for Ions of Different Energy but Same Linear Energy Transfer (LET),” IEEE Trans. Nucl. Sci., NS-35, 1585 (1988).
-
(1988)
IEEE Trans. Nucl. Sci
, vol.NS-35
, pp. 1585
-
-
Stapor, W.J.1
McDonald, P.T.2
Knudson, A.R.3
Campbell, A.B.4
Glagola, B.G.5
-
6
-
-
0020942314
-
Dose Dependence of Single Event Upset Rate in MOS dRams
-
A.R. Knudson, A.B. Campbell, and E.C. Hammond, “Dose Dependence of Single Event Upset Rate in MOS dRams,” IEEE Trans. Nucl. Sci., NS-30, 4508 (1983).
-
(1983)
IEEE Trans. Nucl. Sci
, vol.NS-30
, pp. 4508
-
-
Knudson, A.R.1
Campbell, A.B.2
Hammond, E.C.3
-
7
-
-
0021580682
-
The Total Dose Dependence of the Single Event Upset Sensitivity of IDT Static RAMs
-
A.B. Campbell and W.J. Stapor, “The Total Dose Dependence of the Single Event Upset Sensitivity of IDT Static RAMs,” IEEE Trans. Nucl. Sci., NS-31, 1175 (1984).
-
(1984)
IEEE Trans. Nucl. Sci
, vol.NS-31
, pp. 1175
-
-
Campbell, A.B.1
Stapor, W.J.2
-
8
-
-
0025660891
-
Fast Charge Collection in GaAs MESFETs
-
D. McMorrow, A.R. Knudson, and A.B. Campbell, “Fast Charge Collection in GaAs MESFETs,” IEEE Trans. Nucl. Sci., NS-37, 1902 (1990).
-
(1902)
IEEE Trans. Nucl. Sci
, vol.NS-37
-
-
McMorrow, D.1
Knudson, A.R.2
Campbell, A.B.3
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