Simulation of heavy charged particle tracks using focused laser beams

IEEE Transactions on Nuclear Science

Volumn 34, Issue 6, 1987, Pages 1234-1239

  Richter, A K ^a   Arimura, I ^a  

^a BOEING COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 77957236349     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/TNS.1987.4337458     Document Type: Article

References (15)

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7. I. Arimura and A. C. Day, “Method and Apparatus for Testing Integrated Circuit Susceptibility to Cosmic Rays”, Boeing Patent Application No. 835, 347, 3 March, 1986.
8. See for example, G. Messenger, IEEE Trans. Nucl. Sci., NS-29, No. 6, 2024 (1982), and F. B. McLean and T. R. Oldham, IEEE Trans. Nucl. Sci., NS-29, No. 6, 2018 (1982).
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11. See for example, J. P. Spratt and R. W. Jacobs, “Single Event Upset in Bipolar Technologies”, DNA Report No. DNA-TR-84-365, 1 Oct. 1984
12. J. A. Krinsky, “Single Event Modeling of Schottky-Clamped Bipolar Memory Cells Using SPICE”, Boeing Document No. D180-29733-1, 1 Aug. 1986.
13. T. Criswell, et al., “Measurement of SEU Thresholds and Cross Sections at Fixed Incidence Angles”, (paper presented at the 1987 IEEE Nuclear and Space Radiation Effects Conference, Snowmass, Colorado, July 28–31, 1987).
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15. D. L. Oberg and J. L. Wert, “First Nondestructive Measurements of Power MOSFET Single Event Burnout Cross Sections”, (paper presented at the 1987 IEEE Nuclear and Space Radiation Effects Conference, Snowmass, Colorado, July 28–31, 1987).